Title:
白熱ランプ劣化診断装置およびそれを備えた検査機器およびシステム
Document Type and Number:
Japanese Patent JP6395792
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To detect, at an early stage, the deterioration state of an incandescent lamp.SOLUTION: An incandescent lamp deterioration diagnosis device (10) comprises: a light reception part (11) which receives light emitted from an incandescent lamp (100) that is a deterioration diagnosis target; a spectrometer (12) into which the light thus received by the light reception part (11) is emitted, and which measures a spectrum, in the near-infrared region, of the light thus emitted therein; a differentiation part (112) which differentiates and smooths the spectrum measured by the spectrometer (12) so as to generate a differential spectrum; and a deterioration diagnosis part (113) which diagnoses the deterioration of the incandescent lamp (100) on the basis of the differential spectrum of the incandescent lamp (100) generated by the differentiation part (112).SELECTED DRAWING: Figure 6
Inventors:
Tsuyoshi Ota
Application Number:
JP2016232757A
Publication Date:
September 26, 2018
Filing Date:
November 30, 2016
Export Citation:
Assignee:
Kumahira Manufacturing Co., Ltd.
International Classes:
H05B37/03; G01M11/00; H05B37/02; H05B39/04
Domestic Patent References:
| JP2005037242A | ||||
| JP2003195179A | ||||
| JP2005249507A | ||||
| JP2003247937A |
Attorney, Agent or Firm:
Maeda patent office
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