Title:
INSPECTION DEVICE FOR LOADED PART
Document Type and Number:
Japanese Patent JPH01140005
Kind Code:
A
Abstract:
PURPOSE:To accurately inspect how a chip is loaded on a printed board by a method wherein a chip image is observed by projecting a slit light of a pattern in which lines of two or more colors are alternately displayed. CONSTITUTION:A shutter 1c on an X-axis slit light source 1a is operated to project an X-axis line on a chip part 5, its slit pattern image is read by an image pickup unit 6, and the read signal is digitally converted by an A/D converter 7. Then a shutter 2c is operated to project a Y-axis line and a process same as the above is carried out. An image signal digitally converted is supplied to an image processor 8, where a slit line edge is detected by means of a detection, a calculation and an identification circuits. After calculating its various characteristic values, the information is used to judge how the chip part 5 is loaded. In the above procedure, an X-Y table 4 is moved to sequentially inspect the chip parts 5 in a specific area, allowing all chip parts 5 on a printed board 3 to be inspected with their loading statuses.
Inventors:
KISHIMOTO MAKOTO
MORIMOTO SHUNEI
KAKIMORI NOBUAKI
TAKAHASHI SACHIKUNI
OSAKI MORIHIDE
MORIMOTO SHUNEI
KAKIMORI NOBUAKI
TAKAHASHI SACHIKUNI
OSAKI MORIHIDE
Application Number:
JP30064387A
Publication Date:
June 01, 1989
Filing Date:
November 26, 1987
Export Citation:
Assignee:
SHARP KK
International Classes:
G01B11/24; H04N7/18; (IPC1-7): G01B11/24; H04N7/18
Attorney, Agent or Firm:
Takeshi Sugiyama (1 outside)