Title:
イオントラップ質量分析装置
Document Type and Number:
Japanese Patent JP7215121
Kind Code:
B2
Abstract:
An ion source of an ion trap mass spectrometer generates ions of a component in a sample. An ion trap captures the ions generated by the ion source. An ion detector detects ions ejected from the ion trap. A voltage application control part changes a voltage applied to the ion detector such that, after generation of ions by the ion source is started, ion detection capability of the ion detector during a time period when ions having a mass-to-charge ratio outside an analysis target range are ejected from the ion trap is lower as compared to ion detection capability of the ion detector during a time period when ions having a mass-to-charge ratio within the analysis target range are ejected from the ion trap.
Inventors:
Shuji Shichi
Application Number:
JP2018228514A
Publication Date:
January 31, 2023
Filing Date:
December 05, 2018
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/02; G01N27/62; H01J43/24; H01J49/42
Domestic Patent References:
| JP2001084954A | ||||
| JP2015128031A |
Attorney, Agent or Firm:
Fukushima Shoto
Masahiro Nakagawa
Go Sakane
Hideyuki Sawamura
Masahiro Nakagawa
Go Sakane
Hideyuki Sawamura