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Title:
IRRADIANCE DISTRIBUTION DETECTION METHOD IN EXTREME ULTRAVIOLET LIGHT SOURCE DEVICE, AND LOCATION ADJUSTMENT METHOD FOR LIGHT FOCUSING OPTICAL MEANS
Document Type and Number:
Japanese Patent JP2011198609
Kind Code:
A
Abstract:

To enable to detect in real time when the irradiation distribution characteristics have worsened at or beyond the middle focal point in an extreme ultraviolet light source device, and enable to correct the worsened irradiation distribution.

In an EUV light source device, a cylindrical detection means 20 is installed for detecting EUV beams that do not focus on a middle focal point f. The EUV beams that focus on the middle focal point f pass through an opening 20a of the detection means 20, so that EUV beams that do not focus on the middle focal point f can be detected even during exposure processing. The irradiation distribution of the EUV beams that do not focus on the middle focal point f correlate with the irradiation distribution of the EUV beams that focus on the focal point f and enter the exposure machine, hence, from the worsening of the irradiation distribution of the EUV beams obtained through the detection means 20, it is possible to know the worsening of the irradiation distribution of the EUV beams that focus on the focal point f. In addition, it is possible to improve the irradiation distribution of the EUV beams that enter the exposure machine by moving a light-focusing mirror 6 so as to improve the irradiation distribution of the EUV beams.


Inventors:
YAMATANI DAIKI
Application Number:
JP2010064016A
Publication Date:
October 06, 2011
Filing Date:
March 19, 2010
Export Citation:
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Assignee:
USHIO ELECTRIC INC
International Classes:
H05G2/00; H01L21/027
Domestic Patent References:
JP2004303760A2004-10-28
JP2005294087A2005-10-20
JP2008532232A2008-08-14
JP2009500624A2009-01-08
JP2005294087A2005-10-20
JP2007142361A2007-06-07
Attorney, Agent or Firm:
Shunichiro Nagasawa