Title:
KEY TOP SIZE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2013228234
Kind Code:
A
Abstract:
To provide a key top size inspection device that enables highly precise inspection.
A key top size inspection device includes a laser displacement gauge 18 that irradiates a keyboard 20 with a laser beam to measure the height of the keyboard 20 surface, an acquisition unit 37 that acquires the height according to the position of the laser displacement gauge 18 relative to the keyboard 20, and a calculation unit 38 for calculating the size of a key top 20b of the keyboard 20 on the basis of the acquired height.
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Inventors:
ISHIDA TADASHI
KIYOTA JUNICHI
KIYOTA JUNICHI
Application Number:
JP2012099216A
Publication Date:
November 07, 2013
Filing Date:
April 24, 2012
Export Citation:
Assignee:
FUJITSU COMPONENT LTD
International Classes:
G01B11/02
Attorney, Agent or Firm:
Shuhei Katayama
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