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Title:
計測装置、計測システム、計測プログラム、及び計測方法。
Document Type and Number:
Japanese Patent JP6982910
Kind Code:
B2
Abstract:
Provided are a measurement device, a measurement system, a measurement program, and a measurement method capable of measuring the reflection characteristic of a desired object with a small number of samplings at high speed and high accuracy. According to an embodiment of the present invention, there is provided a reflection characteristic measurement device, comprising: a control unit configured to measure a reflection characteristic of an object based on target information and instruction information, wherein: the target information is information including a coordinate positional relationship among a light source position of an incident light, a light detection position of a reflected light and a measurement point at the object, and numerical values related to the incident light and the reflected light, the incident light is light irradiated to the measurement point, the reflected light is light that the incident light is irradiated to the measurement point and then reflected at the measurement point, the instruction information is information related to an existing measurement result of the reflection characteristic, and the number of combinations of the coordinate positional relationship included in the target information is 1 to 15.

Inventors:
Yoshihiro Watanabe
Masatoshi Ishikawa
Hironosuke Kachi
Application Number:
JP2020532493A
Publication Date:
December 17, 2021
Filing Date:
July 26, 2019
Export Citation:
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Assignee:
National University Corporation Tokyo University
International Classes:
G01N21/47; G01N21/57
Domestic Patent References:
JP2016091359A
JP7077416A
JP2016038222A
JP7150081A
JP2007232652A
JP4072551A
Foreign References:
WO2014189059A1
WO2015133287A1
US20150219557
Other References:
書籍のデジタルアーカイブに向けためくり動作中の高速反射測定計測,ViEW2012 ビジョン技術の実利用ワークショップ,日本,公益社団法人精密工学会画像応用技術専門委員会,2012年12月06日,IS2-D1
モデル間分散を利用した適応的な反射特性計測手法の検討,電子情報通信学会技術研究報告,日本,一般社団法人電子情報通信学会,2018年01月11日,vol. 117, no. 391,PRMU2017-139,ISSN: 2432-6380
反射特性計測の高速化に向けたベイズ最適化を利用したサンプリングの設計,電子情報通信学会技術研究報告,日本,一般社団法人電子情報通信学会,2018年01月11日,vol. 117, no. 391,PRMU2017-138,ISSN: 2432-6380
非負値行列因子分解を用いた空間分布反射特性の推定,電子情報通信学会技術研究報告,日本,一般社団法人電子情報通信学会,2018年01月11日,vol. 117, no. 391,PRMU2017-121,ISSN:3432-6380
Attorney, Agent or Firm:
Patent corporation ipx