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Patent Searching and Data


Title:
MEASURING INSTRUMENT FOR ELECTROOPTIC EFFECT
Document Type and Number:
Japanese Patent JPS6474434
Kind Code:
A
Abstract:

PURPOSE: To find the angle of rotation of a plane of polarization by inputting a signal which is reconverted into linear polarized light by a Senarmont optical system to a Faraday cell and vibrating the plane of polarization of the polarized light, and then providing an analyzer.

CONSTITUTION: The Senarmont optical system polarizes light from a laser light source 1 into linear polarized light by a polarizer 3 and the linear polarized light from the polarizer 3 is projected on a sample 5 to be measured and made into elliptic polarized light, which is reconverted into the linear polarized light through a 1/4-wavelength plate 7. The Faraday cell 13 applies an alternating magnetic field to the linear polarized light from an oscillator 16 to rotate and also vibrate the plane of polarization of the linear polarized light. A detector 15 detects the output of the signal passed through the Faraday cell 13 through the analyzer 14. A lock-in amplifier 11 extracts only a signal component synchronized with the frequency and phase of the oscillator from the detection signal of the detector 15. A recorder 12 records the extracted signal. Consequently, the angle of rotation of the plane of polarization is found.


Inventors:
NAKADA MASAHIRO
SHONO KEIJI
KANO HIROSHI
Application Number:
JP23302487A
Publication Date:
March 20, 1989
Filing Date:
September 17, 1987
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01N21/21; G01M11/00; G01R33/032; G02F1/137; G02F1/141; (IPC1-7): G01M11/00; G01N21/21; G01R33/032; G02F1/137