Title:
MEASURING METHOD FOR DIMENSION OF SLIT CLEARANCE, ADJUSTING METHOD, AND MEASURING DEVICE THEREFOR
Document Type and Number:
Japanese Patent JP2005024406
Kind Code:
A
Abstract:
To measure the dimension of a slit clearance precisely without harming the inside of the slit.
The dimension of the slit clearance is determined as follows: the slit 6 formed between two members 2, 3 is assembled by inserting a film 11, the thickness of which is known, between the two members 2, 3; a film fixture 12 grasps the film 11 and is pulled up by a hoist shaft 16; the film 11 is removed from the slit 15 while measuring the pull up force by a force gauge 14 provided on the middle of the wire 13; and thereby the dimension of the slit clearance can be determined by the thickness of the film and the draw out force.
Inventors:
NAKANO KOICHI
Application Number:
JP2003190564A
Publication Date:
January 27, 2005
Filing Date:
July 02, 2003
Export Citation:
Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G01B21/16; B05C5/02; B05C11/00; B05D1/26; B05D3/00; (IPC1-7): G01B21/16; B05C11/00; B05D1/26; B05D3/00
Attorney, Agent or Firm:
Kyozo Norimatsu