Title:
部材の表面特性の検出方法、部材の表面品質をモニタリングするための前記方法の使用、および部材の表面特性を調整するためのデバイス
Document Type and Number:
Japanese Patent JP7440517
Kind Code:
B2
Abstract:
A method for detecting differences in surface properties of one or more components is provided wherein the infrared radiation emitted by the component at a specific temperature of the component is detected as irradiance on a selected receiver surface relative to the component. When detecting at different positions or on a plurality of components, the solid angle covered by the receiver surface and the distance from the component surface is almost unchanged and differences in the detected irradiance can then be equated with differences in the surface properties of the components. The invention further relates to use of such methods for monitoring and optionally adjusting the surface quality of a component, as well as to a device for adjusting the surface properties in the series production of components.
Inventors:
Schoene, Jens Laurant
Application Number:
JP2021533469A
Publication Date:
February 28, 2024
Filing Date:
November 29, 2019
Export Citation:
Assignee:
Henkel AG & Co. KGaA
International Classes:
G01N25/72; G01N21/47; G01N21/84
Domestic Patent References:
| JP60179638A |
Foreign References:
| WO2008105479A1 | ||||
| US6452180 |
Attorney, Agent or Firm:
Michiko Matsutani
Kenichi Morizumi
Kenichi Morizumi
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