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Title:
METHOD AND DEVICE FOR INSPECTING CAPILLARY OF HEAT EXCHANGER
Document Type and Number:
Japanese Patent JP2011153804
Kind Code:
A
Abstract:

To provide a method and device for inspecting capillaries of a heat exchanger, which prevents wrong selection of capillaries to be inspected and inspection leakage and improves efficiency of inspection work and reliability of inspection.

The method for inspecting the capillaries of the heat exchanger includes: a process of applying an identification code identifying a piping row 21 on a tube bundle 18 and the capillaries 20 within the piping row 21; a process of arranging identification pieces 22 on which the identification code of the capillaries 20 in the piping row 21 is written at actual piping pitches to prepare a partial simulated tube plate 24; a third process of installing the partial simulated tube plate 24 corresponding to the piping row 21 adjacent to an actual inspection piping row 25 of the heat exchanger 11 corresponding to the piping row 21 including the capillaries 20 to be inspected; a process of reading the identification code of the identification pieces 22 arranged adjacent to the capillaries 13 of the heat exchanger 11 corresponding to the capillaries 20 to be inspected and then, inserting an inspection sensor 15 to inside the capillaries 13; and a process of starting inspection when the position of the capillaries 13 by the identification code corresponds to the position of the capillaries 20 to be inspected and recovering the inspection sensor 15 from the capillaries 13 when the position of the capillaries 13 by the identification code does not correspond to the position of the capillaries 20 to be inspected.


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Inventors:
MORI SEIICHIRO
Application Number:
JP2010017141A
Publication Date:
August 11, 2011
Filing Date:
January 28, 2010
Export Citation:
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Assignee:
SHIN NIPPON HIHAKAI KENSA KK
International Classes:
F28F9/02; G01N27/90
Domestic Patent References:
JP2008076180A2008-04-03
JP2003340534A2003-12-02
JP2002288308A2002-10-04
Attorney, Agent or Firm:
Fujio Nakamae
Yoshihiro Kurita