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Title:
METHOD AND DEVICE FOR INSPECTION OF SURFACE
Document Type and Number:
Japanese Patent JPH07229850
Kind Code:
A
Abstract:

PURPOSE: To surely detect only a projection defect without being affected by various kinds of factors of defects.

CONSTITUTION: A sheet-like film 18 is conveyed along rotation of an inspection roller 11 being folded. A scanning light 25 is emitted from a projector 12 so as to be in contact with an inspection section 18a of the film 18 and is inputted to a photodetector 13 after passing through the inspection section 18a. The photodetector 13 sends a photoelectric conversion signal which is proportional to a quantity of the inputted scanning light 25 to a signal processing circuit 17. The signal processing circuit 17 generates a defect-indication signal when a level of the inputted signal is low. An optical glass 15 having parallel surfaces is provided in an optical path of a laser light 20a. An inclination angle of the optical glass 15 is adjusted by a servo device 28, thereby adjusting the height of the scanning light 25.


Inventors:
TAKAHASHI IPPEI
Application Number:
JP1947894A
Publication Date:
August 29, 1995
Filing Date:
February 16, 1994
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G01N21/88; G01N21/89; G01N21/892; G06T1/00; G06T7/00; G01B11/30; (IPC1-7): G01N21/89; G01B11/30; G01N21/88; G06T7/00
Attorney, Agent or Firm:
Kazunori Kobayashi



 
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