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Patent Searching and Data


Title:
METHOD AND DEVICE FOR POLISHING SEMICONDUCTOR SUBSTRATE
Document Type and Number:
Japanese Patent JPH01216768
Kind Code:
A
Abstract:

PURPOSE: To polish a semiconductor wafer to high flatness by rotating a hard plate while uniformly pressing the whole face thereof from its back face via a rigid press plate.

CONSTITUTION: A fluid is fed under pressure into a cylinder 14 to press a press plate 11 of a rigid material via a piston 13, and the whole face of a glass plate 3 is uniformly pressed from its back face via a cushion sheet 12. Thereby, a semiconductor wafer 4 which is bonded to the glass plate 3 is uniformly pressed against a surface plate 1. In this condition, the press plate 11 is rotated via a shaft 8 sliding the semiconductor wafer 4 on the surface of the surface plate 1 to polish the semiconductor wafer by means of the abrasive cloth 2 of the surface plate 1 at a high flatness.


Inventors:
HIRAYAMA KOICHIRO
Application Number:
JP4356488A
Publication Date:
August 30, 1989
Filing Date:
February 25, 1988
Export Citation:
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Assignee:
SHOWA DENKO KK
SHOWA DENKO SILICON KK
International Classes:
H01L21/304; B24B37/005; B24B37/10; (IPC1-7): B24B37/04; H01L21/304
Attorney, Agent or Firm:
Minoru Terada