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Title:
METHOD OF INSPECTING LIGHT EMITTING DIODE LIGHT SOURCE, LED LIGHT SOURCE, AND FILM SCANNING DEVICE
Document Type and Number:
Japanese Patent JP2006352025
Kind Code:
A
Abstract:

To provide a technology that can easily find even one LED device is abnormal in a light source configured by connecting and driving a plurality of LED devices in series.

A plurality of the LED devices are divided into groups of at least two pieces of LED devices or more mutually connected, and forward voltage drop measuring means is provided for measuring the summ of forward voltage drops of each LED device configuring each group. The forward voltage drop measuring means is provided with a voltage detector for taking up the sum of forward voltage drops of each LED device configuring each group, measuring means for measuring the forward voltage drop taken up at the voltage detector, means for comparing the measured forward voltage drop with a reference voltage, means for judging whether or not each measured voltage drop satisfies a predetermined criterion based on comparison results, and means for indicating judgment results.


Inventors:
IWAHASHI HIDEICHIRO
NAKANO SHOICHI
Application Number:
JP2005179521A
Publication Date:
December 28, 2006
Filing Date:
June 20, 2005
Export Citation:
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Assignee:
NORITSU KOKI CO LTD
International Classes:
H01L33/00
Attorney, Agent or Firm:
Katsunori Sugimoto