Title:
METHOD FOR MEASURING LEAK OF HOLLOW STRUCTURE
Document Type and Number:
Japanese Patent JP2525097
Kind Code:
B2
Abstract:
PURPOSE: To measure the leak of a material to be measured without influence of a temperature change of seasons or a temperature change on the way of a manufacturing process or a surroundings temperature change of a hollow structure.
CONSTITUTION: A hollow structure is dipped in a bleacher at a predetermined temperature for a predetermined time, and thereafter, a hollow reference material and the hollow structure as a material to be detected are housed in a closed chamber at a predetermined atmospheric temperature. In the closed chamber, each hollow inside of the hollow reference material and the hollow structure is filled with the high pressure gas, and is sealed. Lowering of the gas pressure of both the sealed hollow reference material and the hollow structure are measured as a pressure difference, and when a pressure difference at a predetermined value or more is detected, the leak of the hollow structure as the material to be detected is measured.
Inventors:
IWAYAMA MASAHIRO
NAWATE HIDE
NAWATE HIDE
Application Number:
JP31184591A
Publication Date:
August 14, 1996
Filing Date:
October 29, 1991
Export Citation:
Assignee:
NAKAMURA KINZOKU KOGYOSHO
International Classes:
G01M3/00; G01M3/26; (IPC1-7): G01M3/26; G01M3/00
Domestic Patent References:
| JP6199832A | ||||
| JP5311081A |
Attorney, Agent or Firm:
Fujikawa Tadashi
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