Title:
MICROWAVE SHAPE MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2023170370
Kind Code:
A
Abstract:
To reduce the number of reference points required for calibration of measurement error due to distortion of a wavefront of a microwave.SOLUTION: A microwave shape measurement method includes: a step S001 of setting a plurality of reference points and arranging a reflector for reflecting a microwave at any of the reference points; a step S003 of receiving a microwave reflected by the reflector; a step S005 of calculating a correction steering vector at any of the reference points corresponding to the distortion of a waveform from a plane wave of the microwave based on the received microwave; a step S007 of determining whether or not the correction steering vector has been calculated for all the reference points; a step S009 of receiving a microwave reflected by an object; and a step S011 of measuring a distance and an azimuth to the object facing an array antenna based on the received microwave and the correction steering vector at the respective reference points.SELECTED DRAWING: Figure 4
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Inventors:
MUROTA KOTA
KINOSHITA TAKAHIRO
KINOSHITA TAKAHIRO
Application Number:
JP2022082070A
Publication Date:
December 01, 2023
Filing Date:
May 19, 2022
Export Citation:
Assignee:
NIPPON STEEL CORP
International Classes:
G01S7/40; G01S7/03
Attorney, Agent or Firm:
Patent Attorney Corporation Dorait International Patent Office