Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PROCESS FOR PRODUCING ACID SENSITIVE POLYMER AND PHOTO RESIST STRUCTURE
Document Type and Number:
Japanese Patent JP2501292
Kind Code:
B2
Abstract:

PURPOSE: To form a positive photo resist exhibiting high sensitivity and resolution and capable of developing in an alkaline aqueous solution free from metal ions by adding a photosensitive acid generator to an arylsilsesquioxane polymer with acid sensitive pendant groups.
CONSTITUTION: By adding a photosensitive acid generator (preferably trifluoromethylsulfonyloxybicyclo[2.2.1]-hepto-5-1-2,3-dicarboxyimide) to an arylsilsesquioxane polymer with an acid sensitive pendant group of the formula (wherein (m) is 0 or 1; (n) is 3 or more; at least 15% of R represents t- butyloxycarbonyl and the other part of R represents H or t-butyloxycarbonyl), a positive silicon-containing photo resist, which exhibits high sensitivity to DUV, e-beam, X-ray exposure system and is capable of developing in an alkaline aqueous solution containing no metal ion, is produced.


Inventors:
UIRIAMU AARU BURANSUORUDO
PUREMURASA JAGANASAN
SUTEIIBU ESU MIURA
MERUIN WAREN MONTOGOMERII
HAABANSU ESU SASHUDEBU
RATONAMU SUURYAKUMARAN
Application Number:
JP21007393A
Publication Date:
May 29, 1996
Filing Date:
August 25, 1993
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
INTAANASHONARU BIJINESU MASHIINZU CORP
International Classes:
C08G77/04; C08G77/16; C08G77/18; C08G77/38; C08L83/04; C08L83/06; G03F7/039; G03F7/075; (IPC1-7): C08G77/38; C08L83/06; G03F7/075
Attorney, Agent or Firm:
Kiyoshi Goda (2 outside)