PURPOSE: To detect a defective mode and correct a detected defective part.
CONSTITUTION: The counter substrate of the inspecting device is arranged opposite a substrate to be inspected, connection terminals of the inspecting device are connected to a gate bus line 1, a source bus line 2, and the counter electrode of the inspecting device, and an ON signal and a following OFF signal which determine one frame period are applied to the line 1 alternately. Further, inspection is carried out by using a 1st pattern for varying a voltage level applied to the line 2 before ON signals of two successive frames are applied, a 2nd pattern for varying the voltage level applied to the line 2 before and after the ON signals are applied, and a 3rd pattern for varying the signal voltage supplied to the line 2 after the ON signals are applied. Consequently, the display part where the defective part is present becomes dark and then the defective mode is detected and corrected.
KATAYAMA MIKIO
OKAMOTO MASAYA
NAKAZAWA KIYOSHI
MIYANOCHI MAKOTO
TACHIBANA MAKOTO
KANAMORI KEN
