Title:
核医学検査装置及び核医学検査方法
Document Type and Number:
Japanese Patent JP6733677
Kind Code:
B2
Abstract:
A nuclear medicine examination method of specifying a position of a radiation source (450) emitted from a specimen (400) by detecting a charged particle generated by Compton scattering in a gas in a chamber (111) of a pixel-type radiation detection device (200) by the detection device, adjusting a type of gas that causes the Compton scattering when detecting radiation emitted from the radiation source (450), wherein the gas that causes the Compton scattering comprises a gas mixture of a rare gas and a gas having a quenching effect, and wherein the rare gas is changed to a rare gas having a larger reactive cross-section in an order of argon, krypton, and xenon with a reduction in amount of radiation emitted from the radiation source (450).
Inventors:
Kohei Ota
Application Number:
JP2017543561A
Publication Date:
August 05, 2020
Filing Date:
September 29, 2016
Export Citation:
Assignee:
Dai Nippon Printing Co.,Ltd.
International Classes:
G01T1/18; G01T1/161; H01J47/06
Domestic Patent References:
| JP2008232971A | ||||
| JP2011196961A | ||||
| JP2004508544A | ||||
| JP59029335A | ||||
| JP2017067654A |
Attorney, Agent or Firm:
Takahashi Hayashi & Partners