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Title:
OPHTHALMOLOGIC APPARATUS AND PUPIL STATE MEASURING METHOD
Document Type and Number:
Japanese Patent JP2022040228
Kind Code:
A
Abstract:
To provide an ophthalmologic apparatus and a pupil state measuring method that can secure accuracy of a measurement result of objective measurement and are effective for investigating a cause of an error at the time of objective measurement.SOLUTION: An ophthalmologic apparatus includes: an eye characteristic measuring part for objectively measuring eye characteristics of an eye to be examined of a subject; at least two imaging parts for imaging the anterior eye part of the eye to be examined from different directions substantially simultaneously while the eye characteristics are being measured by the eye characteristic measuring part; a pupil state measuring part for measuring a pupil state of the eye to be examined on the basis of at least two images of images captured by the at least two imaging parts; and a control part for causing the at least two imaging parts to execute imaging of the anterior eye part of the eye to be examined, and causing the pupil state measuring part to execute measurement of the pupil state of the eye to be examined based on the at least two images.SELECTED DRAWING: Figure 2

Inventors:
NAKAJIMA MASASHI
Application Number:
JP2022001517A
Publication Date:
March 10, 2022
Filing Date:
January 07, 2022
Export Citation:
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Assignee:
TOPCON CORP
International Classes:
A61B3/103; A61B3/11
Domestic Patent References:
JP2005074036A2005-03-24
JP2013248376A2013-12-12
JPS61263437A1986-11-21
JPH05302868A1993-11-16
JPH06335453A1994-12-06
JP2004236688A2004-08-26
JP2004236689A2004-08-26
JP2014226369A2014-12-08
Attorney, Agent or Firm:
Kenzo Matsuura
Kazuki Ohara
Kiyoshi Matsumura
Constitutional Matsuura



 
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