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Title:
PAD FOR POLISHING CHEMICAL MACHINE
Document Type and Number:
Japanese Patent JP2005340271
Kind Code:
A
Abstract:

To provide a pad for polishing a chemical machine which can suitably be adapted to the polishing of a metal film and an insulating film by which a flat polishing face can be obtained and slurry is efficiently removed, and which has a sufficient life, can give high polishing speed, and has a scratch reduction effect.

In the polishing pad, a groove is formed on a polishing face so as to crosse one virtual straight line from the center of the polishing face to a peripheral part for a plurality of times. A groove width is in a range of 0.1 to 1.5 mm, and a groove depth is in a range of 0.9 to 9.8 mm. A minimum distance between adjacent intersections crossing the virtual straight line is in a range of 0.3 to 2.0 mm. A ratio of the depth with respect to the thickness of the polishing pad is in a range of 1/7 to 1/1.1.


Inventors:
KAWAHARA KOJI
HASEGAWA TORU
SAKURAI FUJIO
Application Number:
JP2004153335A
Publication Date:
December 08, 2005
Filing Date:
May 24, 2004
Export Citation:
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Assignee:
JSR CORP
International Classes:
B24B37/20; B24B37/24; B24B37/26; B24D13/14; H01L21/304; (IPC1-7): H01L21/304; B24B37/00
Attorney, Agent or Firm:
Masataka Oshima