Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PARALLEL-TYPE ERROR DETECTION CIRCUIT
Document Type and Number:
Japanese Patent JP2953410
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To reduce the delay of a cell and to improve processing efficiency by error-detecting in parallel and storing a header and a payload obtained by separating an input cell, performing read from a storage means which performs an FEC processing, when error correction is required and performing synthesis and output.
SOLUTION: A separation part 10 separates the header and payload of an ATM cell, check parts 20 and 30 check errors and FEC work buffers 50 and 60 perform storage tentatively. When error correction is required, the check parts 20 and 30 instruct the FEC processing to the buffers 50 and 60, and each error information is reported to a buffer read control part 40. The control part 40 makes the buffers 50 and 60 abandon the cell for which the error is detected in a CRC processing after the FEC processing at the time of read and perform update for each cell, based on the error information. An MUX part 7 synthesizes and outputs the header and the payload outputted by the buffers 50 and 60 after the CRC/FEC processings. Thus, error, error detection and correction processing delay time is reduced.


Inventors:
SATO HIROYUKI
Application Number:
JP30580296A
Publication Date:
September 27, 1999
Filing Date:
October 31, 1996
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NIPPON DENKI KK
International Classes:
H04L1/00; H04B7/26; H04L12/28; H04Q3/00; (IPC1-7): H04L12/28; H04B7/26; H04L1/00
Domestic Patent References:
JP951337A
JP77492A
JP5191430A
Attorney, Agent or Firm:
Asato Kato