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Title:
PHOTOMASK AND METHOD FOR PRODUCING COLOR FILTER USING THE SAME
Document Type and Number:
Japanese Patent JP2009216996
Kind Code:
A
Abstract:

To provide a method for forming a spacer, a sub-spacer and a rib of a color filter by one step of photolithography so that each of them has a high quality.

The photomask 1 has a light shielding pattern 12, a halftone pattern 13 and another light shielding pattern 14 having another halftone pattern 15 on the periphery thereof on a substrate 11. An original color filter 2 obtained by applying a positive photoresist 16 to a substrate 23 is exposed through the photomask 1 and the exposed original color filter is developed to obtain an intermediate color filter 3. The intermediate color filter 3 has the spacer 17 formed correspondingly to the light shielding pattern 12, the rib 19 formed correspondingly to the halftone pattern 13 and the sub-spacer 21 formed according to the light shielding pattern 14 and the halftone pattern 15. The sub-spacer 21 has a high central part and a low peripheral part. When the intermediate color filter 3 is baked, the color filter 4 having the spacer 29, the sub-spacer 33 and the rib 31 are provided.


Inventors:
HAYASHIDA EHAN
SAIJO HIROKAZU
YANO TETSURO
Application Number:
JP2008060945A
Publication Date:
September 24, 2009
Filing Date:
March 11, 2008
Export Citation:
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Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G02B5/20; G02F1/1335
Domestic Patent References:
JP2000075305A2000-03-14
JP2008046623A2008-02-28
JP2003207788A2003-07-25
Foreign References:
WO2006064905A12006-06-22
Attorney, Agent or Firm:
Seiichi Inoue