Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PLASMA TREATMENT METHOD AND APPARATUS THEREFOR
Document Type and Number:
Japanese Patent JP2002367969
Kind Code:
A
Abstract:

To secure uniformity in treatment even if the frequency of high-frequency power to be applied to a plasma source is increased, and to prevent malfunction due to noise.

In the plasma treatment apparatus where high-frequency power is applied to an upper electrode 5 in a first vacuum container 1 to generate plasma, the entire shape of the first vacuum container 1 is set to a shape where an extremely different site is eliminated from a concentric circular shape using the center of a substrate 7 to be treated as a center to secure uniformity in treatment, and a portion around plasma generation space in the first vacuum container 1 is surrounded by a grounded material completely, thus preventing the generation of an electric field at a periphery, setting the pressure of a second vacuum container 15 being connected adjacent to the first vacuum container 1 to 1 Pa or less or 10 Pa or more, and hence preventing malfunction due to noise.


Inventors:
MATSUDA IZURU
OKUMURA TOMOHIRO
MAEKAWA YUKIHIRO
SUMITA KENJI
Application Number:
JP2001176442A
Publication Date:
December 20, 2002
Filing Date:
June 12, 2001
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
H05H1/46; B01J19/08; C23C16/509; H01L21/205; H01L21/302; H01L21/3065; (IPC1-7): H01L21/3065; B01J19/08; C23C16/509; H01L21/205; H05H1/46
Domestic Patent References:
JPH056800A1993-01-14
JPH0645253A1994-02-18
JPH0820879A1996-01-23
JPH0774159A1995-03-17
JP2001148378A2001-05-29
JPH05160039A1993-06-25
JPH0722499A1995-01-24
JPH11238597A1999-08-31
Attorney, Agent or Firm:
Ishihara Masaru