Title:
PLOTTING ELABORATENESS TEST PATTERN, METHOD FOR DECIDING PLOTTING ELABORATENESS USING THIS TEST PATTERN AND DEVICE THEREFOR
Document Type and Number:
Japanese Patent JP2834001
Kind Code:
B2
Abstract:
PURPOSE: To provide a test pattern capable of testing the elaborateness of plotting and a method for decision capable of deciding the elaborateness of plotting by using this test pattern.
CONSTITUTION: This method includes a first stage for plotting the plotting elaborateness test pattern displayed with graphics 2A for plotting a basic subject for modeling and messages 3A for plotting the basic subject on these graphics 2A and for plotting the graphics for plotting the basic subject for modeling displayed at the test pattern on the graphics to be plotted in accordance with the messages 3A, a second stage for reading the shapes plotted on the graphics by this first stage, a third stage for comparing the shape signals read by this second stage with the preset values and a fourth stage for deciding the elaborateness of the plotting by the comparison values obtd. by this third stage.
Inventors:
TAMANO YOSHIO
Application Number:
JP16955694A
Publication Date:
December 09, 1998
Filing Date:
July 21, 1994
Export Citation:
Assignee:
MODAN TAIMUZU JUGEN
International Classes:
G09B19/00; G09B11/10; (IPC1-7): G09B11/10; G09B19/00
Domestic Patent References:
| JP5159634U |
Attorney, Agent or Firm:
Takehiko Suzue