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Patent Searching and Data


Title:
POLISHING PAD AND METHOD FOR POLISHING ARTICLE USING THE SAME
Document Type and Number:
Japanese Patent JP2004311731
Kind Code:
A
Abstract:

To provide a polishing pad capable of high speed polishing while suppressing occurrence of micro polishing scratches when the surface of an interlayer insulating film, a BPSG film, a shallow trench isolating insulation film, a capacitor ferroelectric film, an interconnection metal film, or an article being polished is polished and planarized, or when a buried layer is formed.

The polishing pad having a function for holding particles in polishing agent is produced by fixing organic fibers through substantially non-foaming resin to have an organic fiber content of 50 mass% or above. The polishing pad has Shore D surface hardness of 60 or above and the organic fibers are exposed to the pad surface during polishing work. In the polishing method, surface of an article being polished is applied to the surface of the polishing pad where the organic fibers are exposed and then the article being polished and the polishing pad are slid relatively while supplying slurry polishing agent.


Inventors:
NISHIYAMA MASAYA
SHIMAMURA YASUO
IWATSUKI YASUHITO
TAKAHASHI KATSUHARU
Application Number:
JP2003103622A
Publication Date:
November 04, 2004
Filing Date:
April 08, 2003
Export Citation:
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Assignee:
HITACHI CHEMICAL CO LTD
SHIN KOBE ELECTRIC MACHINERY
International Classes:
B24B37/20; B24B37/24; D21H13/26; D21H19/16; H01L21/304; (IPC1-7): H01L21/304; B24B37/00; D21H13/26; D21H19/16
Attorney, Agent or Firm:
Tetsuo Hotaka