To provide a positive resist composition which is suitable when an exposure light source of ≤160 nm wavelength, in particular, F2 excimer laser light (at 157 nm) is used, and specifically, which exhibits sufficient transparency when a light source of 157 nm is used, and which has various excellent characteristics such as affinity with a developer solution, image forming property and dry etching resistance.
The positive resist composition contains: (A) a resin which has at least each one kind of a repeating unit of a specified structure and a repeating unit having a specified partial structure and the solubility of which increases with an alkali developer by the effect of an acid; and (B) a compound which generates an acid by the effect of active rays or radiation.
MIZUTANI KAZUYOSHI
KANNA SHINICHI
Hironori Honda
Toshimitsu Ichikawa
Takeshi Takamatsu
Yuriko Kuriu
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