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Patent Searching and Data


Title:
POSITIVE RESIST COMPOSITION
Document Type and Number:
Japanese Patent JP2004109834
Kind Code:
A
Abstract:

To provide a positive resist composition which is suitable when an exposure light source of ≤160 nm wavelength, in particular, F2 excimer laser light (at 157 nm) is used, and specifically, which exhibits sufficient transparency when a light source of 157 nm is used, and which has various excellent characteristics such as affinity with a developer solution, image forming property and dry etching resistance.

The positive resist composition contains: (A) a resin which has at least each one kind of a repeating unit of a specified structure and a repeating unit having a specified partial structure and the solubility of which increases with an alkali developer by the effect of an acid; and (B) a compound which generates an acid by the effect of active rays or radiation.


Inventors:
SASAKI TOMOYA
MIZUTANI KAZUYOSHI
KANNA SHINICHI
Application Number:
JP2002275241A
Publication Date:
April 08, 2004
Filing Date:
September 20, 2002
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G03F7/039; C08F216/14; C08F220/12; C08F220/54; C08F228/02; C08F232/04; H01L21/027; (IPC1-7): G03F7/039; C08F216/14; C08F220/12; C08F220/54; C08F228/02; C08F232/04; H01L21/027
Attorney, Agent or Firm:
Shohei Oguri
Hironori Honda
Toshimitsu Ichikawa
Takeshi Takamatsu
Yuriko Kuriu