Title:
陽電子消滅特性の測定装置及び測定方法
Document Type and Number:
Japanese Patent JP7258353
Kind Code:
B2
Abstract:
To provide a device and a method for measuring positron annihilation characteristic, each allowing for stable and highly accurate evaluation of the internal state of a measurement object.SOLUTION: With a device and a method for measuring positron annihilation characteristic, it is possible to evaluate a shift amount between the 0 time (reference time) of a positron life spectrum acquired for type of measurement object and the 0 time of a positron life spectrum acquired with respect to the measurement object and thereby evaluate the internal state of a measurement object that cannot normally be determined by evaluation based on only the positron life. In this case, the calculation of the 0 time of the positron life spectrum is made by calculating as the average time of the 0 time of two positron life spectra and a shift amount between the reference time acquired in accordance with the type of measurement object and the calculated average time, so that it is possible to correct (cancel out) a drift of the positron life spectrum and heighten the accuracy of evaluating the internal state of the measurement object.SELECTED DRAWING: Figure 9
Inventors:
Yamawaki Masato
Application Number:
JP2019214447A
Publication Date:
April 17, 2023
Filing Date:
November 27, 2019
Export Citation:
Assignee:
National Institute of Advanced Industrial Science and Technology
International Classes:
G01T1/172; G01N23/22; G01T1/16
Domestic Patent References:
| JP55158516A |
Other References:
Masato Yamawaki et al.,Importance of starting time for defect analysis using positron annihilation lifetime measurements,Japanese Journal of Applied Physics,2019年11月11日,58, 126501
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