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Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2015130537
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To make a protection circuit used for a semiconductor device function effectively and prevent breakage of the semiconductor device due to surges.SOLUTION: A semiconductor device includes a terminal electrode; a protection circuit; an integrated circuit; and a wiring for electrically connecting them to one another. In the semiconductor device, the protection circuit is provided between the terminal electrode and the integrated circuit, and the terminal electrode, the protection circuit, and the integrated circuit are connected to one another without branching the wiring. Breakage of the semiconductor device caused by electrostatic discharge can be reduced. Occurrence of failures of the semiconductor device can be reduced.

Inventors:
HIROSE ATSUSHI
SHISHIDO HIDEAKI
Application Number:
JP2015077569A
Publication Date:
July 16, 2015
Filing Date:
April 06, 2015
Export Citation:
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Assignee:
SEMICONDUCTOR ENERGY LAB
International Classes:
H01L27/146; H01L21/822; H01L27/04; H01L29/786
Domestic Patent References:
JP2006319180A2006-11-24
JPS5986252A1984-05-18
JP2002270767A2002-09-20
JPH08125030A1996-05-17
JP2008300727A2008-12-11
JPS63147357A1988-06-20
JPH04295826A1992-10-20
JPS61131556A1986-06-19
Foreign References:
US20060261413A12006-11-23



 
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