To provide an efficient semiconductor memory and its test method which can improve test accuracy for products under-estimated in non-volatile memories such as a flash memory and the like and can cope with more various kinds.

This device is provided with memory cell array 2-2 for main storage and a storage means 2-3 storing an estimated result of a process. A test method has plural test flows corresponding to an estimated result of a process in a post-process test after assembly of a semiconductor memory, and a test flow is selected in accordance with an estimated result of a process measured by an estimation pattern at the time of a post-process test.