Title:
SEMICONDUCTOR TEST DEVICE
Document Type and Number:
Japanese Patent JPH1164456
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To detect abnormal power source voltage in concentration and facilitate maintenance by producing abnormality detection code determining priority of the abnormality detection data and abnormal data and outputting to a tester processor. SOLUTION: The main part is constituted of power sources 101 to 164, voltage abnormality detection circuits 201 to 264, an abnormality detection data production part 30, an OR gate 40, a tester processor 50 and a workstation 10. In the abnormality detection data production part 30, if there is abnormality in any of the power sources, one of the output data FL0 to FL64 with 64 bits in voltage abnormality detection circuits 201 to 264 becomes the logic 1, which is logically summed at the OR gate for every 8 bit and input in an encoder. In the case, the abnormal voltage is detected, it is output to the tester processor 50 and the result is forwarded to the workstation 10 as an indication means and displayed on the monitor.
Inventors:
SAITO TAKASHI
Application Number:
JP22343797A
Publication Date:
March 05, 1999
Filing Date:
August 20, 1997
Export Citation:
Assignee:
ADVANTEST CORP
International Classes:
G01R31/00; G01R31/28; (IPC1-7): G01R31/28; G01R31/00