Title:
SEMICONDUCTOR TESTING APPARATUS
Document Type and Number:
Japanese Patent JP3666408
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a driver circuit capable of compensating for losses of any transmission line by adding square waves or triangular waves to original waveforms.
SOLUTION: The driver device comprises a signal generator 1, a register 2 for storing the pulse width data and amplitude data of square waves, a square wave generator 3, square wave generators 3, 4, and 5 for creating square waves according to the pulse width data and the amplitude data stored in the register 2, an adder 6 for adding the output 1a of the signal generator 1, the output 3a of the square wave generator 3, the output 4a of the square wave generator 4, and the output 5a of the square wave generator 5, and an amplifier 7 for amplifying the output 6a of the adder 6. By adding the square wave pluses to signal waveforms, losses of the transmission lines are compensated for.
Inventors:
Tokuo Nakajo
Yoshihiko Hayashi
Yoshihiko Hayashi
Application Number:
JP2001123846A
Publication Date:
June 29, 2005
Filing Date:
March 03, 1995
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
H03K4/02; H03K4/06; H03K5/125; H04B3/06; G01R31/28; (IPC1-7): G01R31/28; H03K4/02; H03K4/06; H03K5/125; H04B3/06
Domestic Patent References:
| JP4189051A | ||||
| JP4115727A | ||||
| JP2111126A | ||||
| JP61220530A | ||||
| JP56033846U |
Attorney, Agent or Firm:
Yasuo Sakuta