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Title:
TANDEM MASS ANALYZING SYSTEM
Document Type and Number:
Japanese Patent JP2007121134
Kind Code:
A
Abstract:

To perform tandem mass analysis with high efficiency without performing waste dissociation and analysis.

This tandem mass analyzing system is equipped with mass analyzing means (14 and 14A) for dissociating a specific ion kind selected from a plurality of parent ions into a plurality of dissociation ions to perform mass analysis and constituted so as to use the dissociation ions dissociated in the front stage as the parent ions to repeat mass analysis. The tandem mass analyzing system is equipped with a database (10) for storing the respective dissociation data of a plurality of the dissociation ions analyzed by mass analysis in the front stage and a combination and determination means (16) for combining a plurality of dissociation data and using the combined dissociation data to determinate a specific ion seed.


Inventors:
YOKOSUKA TOSHIYUKI
KOBAYASHI KINYA
YOSHINARI KIYOMI
HIRABAYASHI TSUDOI
Application Number:
JP2005314393A
Publication Date:
May 17, 2007
Filing Date:
October 28, 2005
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01N27/62
Attorney, Agent or Firm:
Isono Dozo
Etsuo Tada