Title:
温度異常検出装置
Document Type and Number:
Japanese Patent JP6992785
Kind Code:
B2
Abstract:
A temperature abnormality detection device includes a plurality of infrared temperature sensors respectively capable of detecting temperature in a different detection area of an equipment, and a device body including a temperature abnormality determination unit that determines that the temperature in the detection area detected by each of the plurality of infrared temperature sensors is abnormal when the temperature in the detection area is higher than a reference temperature. The plurality of infrared temperature sensors is connected to each other by crossover wiring.
Inventors:
Ryo Ikeuchi
Koji Takatori
Akihiro Nakamura
Hironori Ogawa
Ogawa Ihiko
High Akira Ishi
Koji Takatori
Akihiro Nakamura
Hironori Ogawa
Ogawa Ihiko
High Akira Ishi
Application Number:
JP2019077927A
Publication Date:
January 13, 2022
Filing Date:
April 16, 2019
Export Citation:
Assignee:
OMRON Corporation
International Classes:
H02B3/00; G01J5/00; G01J5/10; H02B13/065
Domestic Patent References:
| JP2009076956A | ||||
| JP2019045192A |
Attorney, Agent or Firm:
Takuji Yamada
Mitsuo Wada
Nobunori Iwaki
Mitsuo Wada
Nobunori Iwaki