Title:
試料を分析検査するためのテスト要素分析システム
Document Type and Number:
Japanese Patent JP7026109
Kind Code:
B2
Abstract:
A test element analysis system for analytical examination of a sample. The system comprises a measurement device, which comprises a test element receptacle for receiving at least one test element at least partially, wherein the receptacle comprises at least one first and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element, wherein the second part is movable relative to the first part, wherein the receptacle is configured to position the second part such that a test element may be inserted into the receptacle and to subsequently position the second part in a closed position such that at least one abutment surface of the second part rests on the test element.
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Inventors:
Fish highter, lars
Stein, liner
Goebel, Martin
Stein, liner
Goebel, Martin
Application Number:
JP2019516600A
Publication Date:
February 25, 2022
Filing Date:
October 12, 2017
Export Citation:
Assignee:
F. HOFFMANN-LA ROCHE AKTIENGESELLSCHAFT
International Classes:
G01N21/78; G01N35/04
Domestic Patent References:
| JP2216032A | ||||
| JP2216058A | ||||
| JP2014185958A | ||||
| JP7005109A | ||||
| JP2016161550A | ||||
| JP2004141332A |
Foreign References:
| WO2010058472A1 | ||||
| US20060128034 |
Attorney, Agent or Firm:
Shinjiro Ono
Osamu Yamamoto
Toru Miyamae
Motoharu Nakanishi
Yukio Kanegae
Osamu Yamamoto
Toru Miyamae
Motoharu Nakanishi
Yukio Kanegae
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