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Title:
TEST METHOD
Document Type and Number:
Japanese Patent JPS61145013
Kind Code:
A
Abstract:

PURPOSE: To reduce the manhour for test and softly manage the variation of the number of test boards and facilitate automatic operation by installing an endless annular conveyor line and a branched conveyor line, in the electronic equipment test.

CONSTITUTION: An electronic apparatus 5 loaded onto a base board 6 is transferred in the direction of arrow A by a conveyor line 10, and a series of processes of receiving test B, fundamental test C, temperature test D, continuous running process E, and forwarding confirmation F are executed. When a trouble i generated in the running process E, the equipment is retreated onto the branched conveyor lines 13 and 14, and trouble removing processing is carried- out. With such constitution, a vacant flat car 6 is sent into the receiving test B by a conveyor after the confirmation F of forwarding. Therefore, the transport of the flat car 6 is avoided, and the necessary manhour can be reduced, and the variation of the number of test boards can be managed, and automatic operation is permitted.


Inventors:
NAKAZAWA SHIGEO
ASAHI KAZUTOSHI
Application Number:
JP26569084A
Publication Date:
July 02, 1986
Filing Date:
December 17, 1984
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01R31/00; B65G17/22; B65G37/00; B65G47/68; G01D21/00; (IPC1-7): B65G37/00; B65G47/68; G01D21/00; G01R31/00
Attorney, Agent or Firm:
Koshiro Matsuoka



 
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