Title:
TESTING METHOD OF SEMICONDUCTOR STORAGE ELEMENT
Document Type and Number:
Japanese Patent JPS6020399
Kind Code:
A
Abstract:
PURPOSE: To shorten a check time by checking a characteristic by the group of a divided storage element.
CONSTITUTION: The storage elements for M bits are divided into N groups for M/N bits, and the storage elements are accessed in every group with a test pattern signal to make a check on the characteristics, so that the time T required for the check satisfies an equation. Therefore, the time T is shortened to 1/N comparing to the case when a test pattern for the storage elements for M bits is used to attain the shortening of the check time. In the equation, (k) is a constant.
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Inventors:
KUNIEDA SHINICHI
Application Number:
JP12900283A
Publication Date:
February 01, 1985
Filing Date:
July 15, 1983
Export Citation:
Assignee:
NIPPON ELECTRIC CO
International Classes:
G01R31/26; G01R31/28; G11C29/04; G11C29/10; G11C29/56; H01L21/66; H01L27/10; (IPC1-7): G01R31/26; G11C29/00; H01L21/66; H01L27/10
Domestic Patent References:
| JPS53120234A | 1978-10-20 | |||
| JPS57189397A | 1982-11-20 | |||
| JPS5641599A | 1981-04-18 |
Attorney, Agent or Firm:
Shin Uchihara
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