Title:
スポット照明機構付紫外線探傷灯
Document Type and Number:
Japanese Patent JP7165579
Kind Code:
B2
Abstract:
To provide an ultraviolet flaw detection lamp with a spot lighting mechanism capable of adjusting the surface of a specimen so as to be able to be irradiated with spot light of an illuminance of the same degree even if a distance between a specimen and spot illumination is changed in a fluorescent magnetic powder flaw test method and a fluorescence penetrant flaw detection test method.SOLUTION: Disclosed is an ultraviolet flaw detection lamp with a spot lighting mechanism, which is composed of an ultraviolet ray irradiation body provided with an ultraviolet ray light source, and a base part integrally provided in the ultraviolet ray irradiation body and in which the spot lighting mechanism 30 for irradiating visible light is provided in the base part. The spot lighting mechanism 30 includes: a lamp housing 40; a lens casing 60; a switching ring 50 having a visible light source; a lens 32 fitted on the front surface of the lens casing 60; and a biasing member 33.SELECTED DRAWING: Figure 3
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Inventors:
Kenji Matsumoto
Hosoya Manabu
Hosoya Manabu
Application Number:
JP2018245618A
Publication Date:
November 04, 2022
Filing Date:
December 27, 2018
Export Citation:
Assignee:
MARKTEC Corporation
International Classes:
G01N21/84; F21S2/00; F21V5/04; F21V13/02; F21V14/02; F21V14/06; F21V19/02; G01N21/91
Domestic Patent References:
| JP200074842A | ||||
| JP942953A | ||||
| JP5178689U | ||||
| JP5025383U | ||||
| JP2004221042A | ||||
| JP200710380A | ||||
| JP5729843U |
Attorney, Agent or Firm:
Satoshi Watanabe
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