Title:
X-RAY APPARATUS AND X-RAY MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2014014670
Kind Code:
A
Abstract:
To provide an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray flux as compared with known art.
An X-ray apparatus includes detector means having pixels configured to detect an intensity of the X-ray flux which has been split by a splitting element and has passed through an object to be detected. The X-ray apparatus also includes an absorbing element arranged between two pixels of the detector means and configured to absorb part of the X-ray flux.
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Inventors:
MUKAIDE TAIHEI
NIINUMA YUTO
NIINUMA YUTO
Application Number:
JP2013125722A
Publication Date:
January 30, 2014
Filing Date:
June 14, 2013
Export Citation:
Assignee:
CANON KK
International Classes:
A61B6/00; G01T7/00; G03B42/02
Attorney, Agent or Firm:
Takuma Abe
Sogo Kuroiwa
Sogo Kuroiwa