Title:
A detecting method of target particles
Document Type and Number:
Japanese Patent JP5940644
Kind Code:
B2
Abstract:
The present invention provides a method for indirectly and with high sensitivity detecting a particle dispersed and moving randomly in a solution using a luminescent probe. In the present invention, (a) a solution is prepared that contains a target particle and one or more types of a luminescent probe that directly or indirectly binds to the target particle, (b) a complex is formed that contains the target particle and the luminescent probe in the solution, (c) the complex is recovered by separating luminescent probe not bound to the target particle from the solution containing the complex, followed by (d) dissociating the luminescent probe from the recovered complex and mutually separating and separately recovering the free luminescent probe and target particle, (e) steps for again binding a luminescent probe to the recovered target particle followed by dissociating the luminescent probe and mutually separating and recovering free luminescent probe and the target particle are repeated, followed by preparing a single measurement sample solution containing the total amount of the recovered free luminescent probe, and (f) the number of molecules of the luminescent probes in the measurement sample solution is calculated.
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Inventors:
Hidetaka Nakata
Application Number:
JP2014500874A
Publication Date:
June 29, 2016
Filing Date:
December 04, 2012
Export Citation:
Assignee:
Olympus Endo Technology America Inc.
International Classes:
G01N21/64; G01N21/77
Domestic Patent References:
JP2008298743A | ||||
JP2010019553A | ||||
JP2004121231A |
Foreign References:
WO2012014778A1 |
Attorney, Agent or Firm:
Sumio Tanai
Masatake Shiga
Suzuki Mitsuyoshi
Tadao Takashiba
Shiro Suzuki
Hiroyuki Hashimoto
Masatake Shiga
Suzuki Mitsuyoshi
Tadao Takashiba
Shiro Suzuki
Hiroyuki Hashimoto