Title:
METHOD FOR ADJUSTING REGULAR SAMPLE AND MICROSCOPE
Document Type and Number:
Japanese Patent JP2018100941
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method for adjusting a regular sample and a microscope, the method allowing a determination of an insufficient adjustment of an optical element used for a PO observation method before the spindle body in an egg is observed by the PO observation method.SOLUTION: A regular sample SP1 is a regular sample used in a microscope employed for processing the sample by a polarization observation method, and includes a first site SP2 and a second site SP3 next to the first site SP2, the second site having a similar retardation to that of the spindle body in an egg, and the first and second sites SP2 and SP3 having different retardations.SELECTED DRAWING: Figure 1
Inventors:
NISHIGUCHI SHIGETAKA
AIDA KAZUFUMI
SUZUKI HIROFUMI
KANEKI SHINSUKE
AIDA KAZUFUMI
SUZUKI HIROFUMI
KANEKI SHINSUKE
Application Number:
JP2016248204A
Publication Date:
June 28, 2018
Filing Date:
December 21, 2016
Export Citation:
Assignee:
OLYMPUS CORP
International Classes:
G01N1/00; G01N21/17; G01N21/21; G02B21/34
Domestic Patent References:
| JP2014092641A | 2014-05-19 | |||
| JP2016024358A | 2016-02-08 | |||
| JP2014197107A | 2014-10-16 | |||
| JP2005193514A | 2005-07-21 | |||
| JP2007527991A | 2007-10-04 |
Foreign References:
| WO2012150689A1 | 2012-11-08 |
Attorney, Agent or Firm:
Sakai International Patent Office