Title:
試験測定プローブ
Document Type and Number:
Japanese Patent JP7231992
Kind Code:
B2
Abstract:
Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.
Inventors:
Jonathan S. Dandy
Application Number:
JP2018130960A
Publication Date:
March 02, 2023
Filing Date:
July 10, 2018
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R15/04; G01R1/06; G01R13/20; G01R19/32
Domestic Patent References:
| JP886808A | ||||
| JP6331657A | ||||
| JP201025954A | ||||
| JP2010121956A | ||||
| JP2009145172A | ||||
| JP5367477U | ||||
| JP2016102748A |
Foreign References:
| US8723530 |
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yamaguchi International Patent Office
Yoshio Arafune
Yamaguchi International Patent Office