Title:
ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/115827
Kind Code:
A1
Abstract:
This abnormality detection device is provided with: an outlier score calculation unit (3) which calculates, from abnormality detection time-series data and as an abnormality detection outlier score, the degree of abnormality exhibited at each of a plurality of times by a facility for which abnormalities are to be detected, said abnormality detection time-series data representing a time series of the state of the facility at the plurality of times; an outlier data extraction unit (4) which, on the basis of the abnormality detection outlier score at each of the plurality of times as calculated by the outlier score calculation unit (3), extracts, from the abnormality detection time-series data and as outlier data, abnormality detection time-series data for a time period during which an abnormality may have occurred in the facility; and an abnormality determination unit (8) which compares the waveform of the abnormality detection outlier data extracted by the outlier data extraction unit (4) with waveform conditions for determining that a waveform representing changes in the abnormality detection outlier data matches a waveform obtained when the facility is operating normally, and determines whether or not the facility is operating abnormally, on the basis of the result of the comparison between the waveform conditions and the waveform of the abnormality detection outlier data.
Inventors:
NAKAMURA TAKAAKI (JP)
Application Number:
PCT/JP2018/044643
Publication Date:
June 11, 2020
Filing Date:
December 05, 2018
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02
Domestic Patent References:
| WO2018207350A1 | 2018-11-15 | |||
| WO2014041971A1 | 2014-03-20 |
Foreign References:
| JP2016128973A | 2016-07-14 |
Other References:
CHIN-CHIA MICHAEL YEHYAN ZHULIUDMILA ULANOVANURJAHAN BEGUMYIFEI DINGHOANG ANH DAUDIEGO FURTADO SILVAABDULLAH MUEENEAMONN KEOGH, MATRIX PROFILE I: ALL PAIRS SIMILARITY JOINS FOR TIME SERIES: A UNIFYING VIEW THAT INCLUDES MOTIFS, DISCORDS AND SHAPELETS, 2016
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
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