Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/281872
Kind Code:
A1
Abstract:
This abnormality determination device comprises: an acquisition unit which acquires the resistance value and the electric power value of an electric heating element of a heater that are calculated from voltage between both ends of the electric heating element and an electric current flowing through the electric heating element; a first determination unit which, on the basis of the acquired resistance value, makes an abnormality determination that is a determination as to whether the heater is abnormal or not; and a second determination unit which determines whether the acquired electric power value is in an electric power-stabilized state within the range of a first target value or not. The first determination value makes the abnormality determination on the basis of the acquired resistance value when the second determination unit determines that the acquired electric power value is in the electric power-stabilized state over a first period.
Inventors:
TAKATANI RYOHEI (JP)
YAMAGUCHI SHOHEI (JP)
YAMADA TAKAAKI (JP)
YAMAGUCHI SHOHEI (JP)
YAMADA TAKAAKI (JP)
Application Number:
PCT/JP2022/015632
Publication Date:
January 12, 2023
Filing Date:
March 29, 2022
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H05B3/00
Foreign References:
| JP2011108596A | 2011-06-02 | |||
| JP2008134302A | 2008-06-12 | |||
| JP2006085907A | 2006-03-30 | |||
| JP2013084478A | 2013-05-09 | |||
| JPH08124653A | 1996-05-17 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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