Title:
ABNORMALITY-MONITORING SYSTEM, ABNORMALITY-MONITORING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/100912
Kind Code:
A1
Abstract:
This abnormality-monitoring system (80) is a system for monitoring abnormalities in an electromagnetic field spatial distribution measurement system (10) provided with a reference signal generator (second EO probe (22), etc.) for generating a reference signal, a measurement probe (first EO probe (21), etc.) for detecting an electrical field while scanning a measurement point in an electromagnetic field having a given relationship with the reference signal, and a signal-processing unit (signal-processing unit (30), etc.) for calculating the amplitude and the phase of the electrical field indicated by a measurement signal outputted by the measurement probe and outputting the calculated amplitude and phase as measurement results, the abnormality-monitoring system comprising a distributor (50), etc., for distributing the reference signal, and a monitoring unit (62) for determining the presence/absence of an abnormality in the electromagnetic field spatial distribution measurement system (10) on the basis of the reference signal distributed by the distributor (50), etc.
Inventors:
NISHIMURA KOTA (JP)
SUGIYAMA TAKESHI (JP)
SUGIYAMA TAKESHI (JP)
Application Number:
PCT/JP2023/006040
Publication Date:
May 16, 2024
Filing Date:
February 20, 2023
Export Citation:
Assignee:
PHOTONIC EDGE INC (JP)
International Classes:
G01R29/10; G01R29/08; G01R35/00
Domestic Patent References:
| WO2017026494A1 | 2017-02-16 | |||
| WO2018164110A1 | 2018-09-13 |
Foreign References:
| JPH0527683U | 1993-04-09 | |||
| JPS6146462U | 1986-03-28 | |||
| JP2003185689A | 2003-07-03 | |||
| CN111337780A | 2020-06-26 |
Attorney, Agent or Firm:
NII, Hiromori (JP)
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