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Patent Searching and Data


Title:
ACTINIC LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR PRODUCING ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/054275
Kind Code:
A1
Abstract:
Provided is an actinic light sensitive or radiation sensitive resin composition that has excellent resolution and that enables the formation of a pattern having excellent LWR. Also provided are a resist film, a pattern forming method, and a method for producing an electronic device. This actinic light sensitive or radiation sensitive resin composition contains a resin and a photoacid generator. The resin contains a repeating unit containing a partial structure represented by formula (2) and at least one repeating unit selected from the group consisting of a repeating unit containing a group having a polarity that is increased by the action of an acid, a repeating unit represented by general formula (1-1), and a repeating unit represented by formula (1-2).

Inventors:
TAKADA AKIRA (JP)
KAWASHIMA TAKASHI (JP)
ASAKAWA DAISUKE (JP)
YAMAMOTO KEI (JP)
MARUMO KAZUHIRO (JP)
Application Number:
PCT/JP2019/031107
Publication Date:
March 19, 2020
Filing Date:
August 07, 2019
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G03F7/038; C08F220/10; G03F7/039; G03F7/20
Foreign References:
JP2015045702A2015-03-12
JP2013151592A2013-08-08
JP2009223294A2009-10-01
JP2011180385A2011-09-15
JPS5652404B21981-12-11
JP2011227463A2011-11-10
JP2014010436A2014-01-20
JP2013113915A2013-06-10
JP2013228550A2013-11-07
JP2012088449A2012-05-10
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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