Title:
ADAPTIVE VOICE INTELLIGIBILITY PROCESSOR
Document Type and Number:
WIPO Patent Application WO/2013/019562
Kind Code:
A3
Abstract:
Systems and methods for adaptively processing speech to improve voice intelligibility are described. These systems and methods can adaptively identify and track formant locations, thereby enabling formants to be emphasized as they change. As a result, these systems and methods can improve near-end intelligibility, even in noisy environments. The systems and methods can be implemented in Voice-over IP (VoIP) applications, telephone and/or video conference applications (including on cellular phones, smart phones, and the like), laptop and tablet communications, and the like. The systems and methods can also enhance non-voiced speech, which can include speech generated without the vocal track, such as transient speech.
Inventors:
NOH DAEKYOUNG (US)
HE XING (US)
TRACEY JAMES (US)
HE XING (US)
TRACEY JAMES (US)
Application Number:
PCT/US2012/048378
Publication Date:
March 20, 2014
Filing Date:
July 26, 2012
Export Citation:
Assignee:
DTS LLC (US)
NOH DAEKYOUNG (US)
HE XING (US)
TRACEY JAMES (US)
NOH DAEKYOUNG (US)
HE XING (US)
TRACEY JAMES (US)
International Classes:
G10L21/003; G10L19/07; G10L21/0316; G10L21/0364; G10L25/15
Domestic Patent References:
| WO2001031632A1 | 2001-05-03 |
Foreign References:
| US20040042622A1 | 2004-03-04 | |||
| GB2327835A | 1999-02-03 | |||
| US6768801B1 | 2004-07-27 |
Attorney, Agent or Firm:
KING, John, R. (Martens Olson & Bear, LLP.,2040 Main Street, 14th Floo, Irvine CA, US)
Download PDF:
Previous Patent: NUCLEAR TRANSPORT MODULATORS AND USES THEREOF
Next Patent: METHOD AND SYSTEM FOR VISUALIZATION OF SEMICONDUCTOR WAFER INSPECTION DATA
Next Patent: METHOD AND SYSTEM FOR VISUALIZATION OF SEMICONDUCTOR WAFER INSPECTION DATA