Title:
AI APPEARANCE INSPECTION METHOD, DEVICE FOR SAME, AND PROGRAM FOR USE IN COMPUTER
Document Type and Number:
WIPO Patent Application WO/2021/100243
Kind Code:
A1
Abstract:
The present invention addresses the problem that, in settings where the appearance of precision components is inspected, in addition to the high precision that is required as a matter of course, the amount of time required in order to allow an AI appearance inspection device to learn also increases in association with an increase in the number of varieties of the components. Provided is an AI appearance inspection method comprising a pre-processing step for learning in which a difference image (teaching data) between a reference image prepared in advance and a teaching image of a component for which the appearance is to be inspected is produced as data representing a normal instance of the component for which the appearance is to be inspected, an input step for learning in which the difference image (teaching data) is inputted to an AI appearance inspection unit, an AI processing step for learning in which the AI appearance inspection unit is caused to process the inputted difference image (teaching data) and to learn the relationship between a difference image (normal instance) and a difference image (abnormal instance), a pre-processing step for inspection in which a difference image (inspection data) between the reference image and an actually captured image of the component for which the appearance is to be inspected is produced, an input step for inspection in which the difference image (inspection data) is inputted to an AI appearance inspection device that has finished learning, and an AI processing step for inspection in which the AI appearance processing unit that has finished learning is caused to process the inputted difference image (inspection data) and to specify a first relationship for the inputted difference image (inspection data).
Inventors:
ISHIGURO TAKAYUKI (JP)
Application Number:
PCT/JP2020/027585
Publication Date:
May 27, 2021
Filing Date:
July 16, 2020
Export Citation:
Assignee:
TKMES CORP (JP)
International Classes:
G01N21/88
Domestic Patent References:
| WO2016174926A1 | 2016-11-03 |
Foreign References:
| JP2001127129A | 2001-05-11 | |||
| JP2019095217A | 2019-06-20 | |||
| JP2001022926A | 2001-01-26 | |||
| JP2012026982A | 2012-02-09 | |||
| JP2009229200A | 2009-10-08 | |||
| JP2004038885A | 2004-02-05 | |||
| JP2014182064A | 2014-09-29 | |||
| US20180260665A1 | 2018-09-13 |
Attorney, Agent or Firm:
KONISHI, Tomimasa (JP)
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