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Title:
AIR FLOW RATE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/045118
Kind Code:
A1
Abstract:
This air flow rate measurement device comprises: a housing (30) having a base surface (41), a rear surface (42) located opposite to the base surface, side surfaces (51, 52), a flow rate flow path inlet (431) formed in the base surface, a flow rate flow path outlet (432) formed in the rear surface, flow rate flow paths (43, 44) in communication with the flow rate flow path inlet and the flow rate flow path outlet, a physical quantity flow path inlet (500) formed in the base surface, physical quantity flow path outlets (501, 502) formed in the side surfaces, and a physical quantity flow path (50) in communication with the physical quantity flow path inlet and the physical quantity flow path outlets; a flow rate detection unit (75) for outputting a signal indicating the flow rate of air flowing through the flow rate flow paths; and a physical quantity detection unit (81) for outputting a signal indicating a physical quantity of air flowing through the physical quantity flow path. The physical quantity flow path includes a physical quantity flow path inner surface (55) located on the rear surface side of the physical quantity flow path. The physical quantity flow path outlets include outlet flow straightening surfaces (921, 922) connected to side–surface-side ends of the physical quantity flow path inner surface and to the side surfaces. Air in the physical quantity flow path outlets flows along the outlet flow straightening surfaces, thereby providing the flows of air in the physical quantity flow path outlets with flows along the side surfaces.

Inventors:
WATANABE TAICHI (JP)
Application Number:
PCT/JP2020/033287
Publication Date:
March 11, 2021
Filing Date:
September 02, 2020
Export Citation:
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Assignee:
DENSO CORP (JP)
International Classes:
G01F1/684
Domestic Patent References:
WO2019131297A12019-07-04
Foreign References:
JP2018204993A2018-12-27
JP2014508945A2014-04-10
Attorney, Agent or Firm:
YOU-I PATENT FIRM (JP)
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