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Title:
ALIGNMENT SYSTEM, ALIGNMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/023974
Kind Code:
A1
Abstract:
This alignment system (1) comprises: an imaging device (300) that images a workpiece (10) having a portion to be identified; an image processing unit (400) that detects the portion to be identified from a captured image of the workpiece (10) that is acquired from the imaging device (300); and an operation control unit (200) that, on the basis of actual coordinates of the portion to be identified that is detected by the image processing unit (400), controls a drive apparatus (111, 112, 113) for causing the workpiece (10) to move. The image processing unit (400) determines a transfer range of the image on the basis of the actual coordinates of the portion to be identified and detects the portion to be identified from the captured image within the transfer range, the captured image being acquired from the imaging device according to a transfer instruction by which the transfer range is designated.

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Inventors:
LEE WEIHAU (JP)
ASANO YUJI (JP)
SUGIYAMA YOSHIHIRO (JP)
Application Number:
PCT/JP2022/028956
Publication Date:
February 01, 2024
Filing Date:
July 27, 2022
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05D3/12
Foreign References:
JP2019215633A2019-12-19
JPH05332742A1993-12-14
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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