Title:
ALIGNMENT SYSTEM, ALIGNMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/023975
Kind Code:
A1
Abstract:
An alignment system (1) comprises: an image processing unit (400) that detects an identification subject from a captured image obtained by capturing an image of a workpiece (10) having the identification subject; and an operation control unit (200) that controls drive devices (111, 112, 113) for moving the workpiece (10) on the basis of real coordinates of the identification subject detected by the image processing unit (400). The image processing unit (400) determines a search range having predetermined magnitude which is a part of the captured image, on the basis of position information generated from a position sensor output of the drive devices (111, 112, 113), and detects the identification subject from the image in the search range.
Inventors:
ASANO YUJI (JP)
LEE WEIHAU (JP)
SUGIYAMA YOSHIHIRO (JP)
LEE WEIHAU (JP)
SUGIYAMA YOSHIHIRO (JP)
Application Number:
PCT/JP2022/028957
Publication Date:
February 01, 2024
Filing Date:
July 27, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05D3/12
Foreign References:
| JP2019215633A | 2019-12-19 | |||
| JP2022045522A | 2022-03-22 |
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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